Investigation of the electronic structure of amorphous SnO...

Applied Physics Letters 2020 / 02 Vol. 116; Iss. 5

Investigation of the electronic structure of amorphous SnO film using x-ray absorption spectroscopy

Mohamed, Ahmed Yousef, Lee, Seung Yeon, Lee, Seung Jun, Hwang, Cheol Seong, Cho, Deok-Yong
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Volume:
116
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.5140518
Date:
February, 2020
File:
PDF, 1.16 MB
english, 2020
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