[IEEE 2019 IEEE International Test Conference India (ITC India) - Bangalore, India (2019.7.21-2019.7.23)] 2019 IEEE International Test Conference India (ITC India) - Test cost reduction through increase in multi-site testing with reduced scan-out pins
Shenoy, Jaidev, Ockunzzi, Kelly, Kamal, Kushal, Singh, VirendraYear:
2019
DOI:
10.1109/ITCIndia46717.2019.8979671
File:
PDF, 1.73 MB
2019