[IEEE 2019 IEEE International Test Conference India (ITC...

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[IEEE 2019 IEEE International Test Conference India (ITC India) - Bangalore, India (2019.7.21-2019.7.23)] 2019 IEEE International Test Conference India (ITC India) - Test cost reduction through increase in multi-site testing with reduced scan-out pins

Shenoy, Jaidev, Ockunzzi, Kelly, Kamal, Kushal, Singh, Virendra
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Year:
2019
DOI:
10.1109/ITCIndia46717.2019.8979671
File:
PDF, 1.73 MB
2019
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