Detection and Classification of Defects Using ECT and...

IEEE Sensors Journal 2020 / 3 Vol. 20; Iss. 5

Detection and Classification of Defects Using ECT and Multi-Level SVM Model

Pasadas, Dario Jeronimo, Baskaran, Prashanth, Ramos, Helena Geirinhas, Ribeiro, Artur Lopes
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Volume:
20
Journal:
IEEE Sensors Journal
DOI:
10.1109/JSEN.2019.2951302
Date:
March, 2020
File:
PDF, 3.25 MB
2020
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