Single-Particle Cryo-Electron Microscopy: Mathematical...

IEEE Signal Processing Magazine 2020 / 3 Vol. 37; Iss. 2

Single-Particle Cryo-Electron Microscopy: Mathematical Theory, Computational Challenges, and Opportunities

Bendory, Tamir, Bartesaghi, Alberto, Singer, Amit
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Volume:
37
Journal:
IEEE Signal Processing Magazine
DOI:
10.1109/MSP.2019.2957822
Date:
March, 2020
File:
PDF, 1.96 MB
2020
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