Quantification of point and line defects in Si0.6Ge0.4...

Applied Surface Science 2020 / 05 Vol. 513

Quantification of point and line defects in Si0.6Ge0.4 alloys with thickness variation via optical pump-THz probe measurement

Kim, Jonghoon, Jeong, Kwangsik, Baik, Min, Kim, Dae-Kyoung, Chae, Jimin, Park, Hanbum, Hong, Seok-Bo, Ko, Dae-Hong, Cho, Mann-Ho
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Volume:
513
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2020.145815
Date:
May, 2020
File:
PDF, 2.83 MB
2020
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