Point defects in BaSi 2 thin films for photovoltaic applications studied by positron annihilation spectroscopy
Montes, A., Eijt, S. W. H., Tian, Y., Gram, R., Schut, H., Suemasu, T., Usami, N., Zeman, M., Serra, J., Isabella, O.Volume:
127
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5126264
Date:
February, 2020
File:
PDF, 2.11 MB
2020