Modeling of neutron radiation-induced defects in silicon...

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Semiconductor Science and Technology 2020 / 02

Modeling of neutron radiation-induced defects in silicon particle detectors

Jain, Chakresh, Saumya, Saumya, Jain, Geetika, Dalal, Ranjeet, Agrawal, Namrata, Bhardwaj, Ashutosh, Ranjan, Kirti
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Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab74ea
Date:
February, 2020
File:
PDF, 1.24 MB
2020
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