Investigation on 4H-SiC gate turn-off thyristor with direct carrier extraction access to drift region for power conversion applications
Liang, Shiwei, Wang, Jun, Fang, Fang, Liu, Hangzhi, Deng, WenjuanJournal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab76fa
Date:
February, 2020
File:
PDF, 755 KB
2020