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Semiconductor Science and Technology 2020 / 02

Delay analysis of high electron mobility transistors under high drain bias

Reiser, Korbinian, Twynam, John, Brech, Helmut, Weigel, Robert
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Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab78f5
Date:
February, 2020
File:
PDF, 680 KB
2020
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