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Radiation sustenance of HfO2/β-Ga2O3 metal-oxide-semiconductor capacitors: Gamma irradiation study
Manikanthababu, N., Tak, Bhera Ram, Kunche, Prajna, Singh, Rajendra, Panigrahi, B KJournal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab7b8b
Date:
March, 2020
File:
PDF, 979 KB
2020