Investigation of Gate Oxide Traps Effect on NAND Flash Memory by TCAD Simulation
Zhang, Hekun, Tian, Xuan, He, Junpeng, Song, Zhe, Yu, Qianqian, Li, Liang, Li, Ming, Zhao, Liancheng, Gao, LimingJournal:
Chinese Physics B
DOI:
10.1088/1674-1056/ab695f
Date:
January, 2020
File:
PDF, 566 KB
2020