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Probabilistic measurement modelling may overcome the opposition between the Bayesian and the frequentistic views
Battista Rossi, Giovanni, Crenna, FrancescoVolume:
1379
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/1379/1/012002
Date:
November, 2019
File:
PDF, 620 KB
2019