X-ray microanalysis of silumin subjected to intense pulsed...

X-ray microanalysis of silumin subjected to intense pulsed electron beam treatment

Petrikova, E A, Teresov, A D, Tolkachov, O S, Ivanov, Yu F, Petrikova, E A, Teresov, A D, Tolkachov, O S, Ivanov, Yu F
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
1393
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/1393/1/012113
Date:
November, 2019
File:
PDF, 3.50 MB
2019
Conversion to is in progress
Conversion to is failed