X-ray microanalysis of silumin subjected to intense pulsed electron beam treatment
Petrikova, E A, Teresov, A D, Tolkachov, O S, Ivanov, Yu F, Petrikova, E A, Teresov, A D, Tolkachov, O S, Ivanov, Yu FVolume:
1393
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/1393/1/012113
Date:
November, 2019
File:
PDF, 3.50 MB
2019