Analysis of doping distribution in horizontal GaAs...

Journal of Physics Conference Series 2019 / 12 Vol. 1410

Analysis of doping distribution in horizontal GaAs nanowires with axial p-n junction by the conductive atomic force microscopy

Borodin, B R, Alekseev, P A, Dunaevskiy, M S, Khayrudinov, V, Lipsanen, H
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Volume:
1410
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/1410/1/012228
Date:
December, 2019
File:
PDF, 595 KB
2019
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