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Electric field distribution in Si detectors irradiated with 40 Ar ions: experimental study and simulation
Verbitskaya, E., Eremin, V., Shepelev, A.Volume:
15
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/15/02/P02017
Date:
February, 2020
File:
PDF, 2.48 MB
2020