[IEEE 2019 34th IEEE/ACM International Conference on Automated Software Engineering Workshop (ASEW) - San Diego, CA, USA (2019.11.11-2019.11.15)] 2019 34th IEEE/ACM International Conference on Automated Software Engineering Workshop (ASEW) - Predicting Defects with Latent and Semantic Features from Commit Logs in an Industrial Setting
Eken, Beyza, Atar, RiFat, Sertalp, Sahra, Tosun, AyseYear:
2019
DOI:
10.1109/ASEW.2019.00038
File:
PDF, 5.34 MB
2019