[IEEE 2019 8th International Congress on Advanced Applied...

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[IEEE 2019 8th International Congress on Advanced Applied Informatics (IIAI-AAI) - Toyama, Japan (2019.7.7-2019.7.11)] 2019 8th International Congress on Advanced Applied Informatics (IIAI-AAI) - Clarification of Relationship between Projective Tests and Questionnaires

Komatsu, Shogo, Aoki, Koichiro, Kato, Chieko
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Year:
2019
DOI:
10.1109/IIAI-AAI.2019.00194
File:
PDF, 3.06 MB
2019
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