![](/img/cover-not-exists.png)
[IEEE 2019 8th International Congress on Advanced Applied Informatics (IIAI-AAI) - Toyama, Japan (2019.7.7-2019.7.11)] 2019 8th International Congress on Advanced Applied Informatics (IIAI-AAI) - Clarification of Relationship between Projective Tests and Questionnaires
Komatsu, Shogo, Aoki, Koichiro, Kato, ChiekoYear:
2019
DOI:
10.1109/IIAI-AAI.2019.00194
File:
PDF, 3.06 MB
2019