[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - SoC Security Verification using Property Checking
Farzana, Nusrat, Rahman, Fahim, Tehranipoor, Mark, Farahmandi, FarimahYear:
2019
DOI:
10.1109/ITC44170.2019.9000170
File:
PDF, 2.10 MB
2019