[IEEE 2019 IEEE International Test Conference India (ITC India) - Bangalore, India (2019.7.21-2019.7.23)] 2019 IEEE International Test Conference India (ITC India) - A hierarchical approach to self-test, fault-tolerance and routing security in a Network-on-Chip
Ravikumar, C.P., Swamy, S. Kendaganna, Uma, B.V.Year:
2019
DOI:
10.1109/ITCIndia46717.2019.8979997
File:
PDF, 4.44 MB
2019