[IEEE 2019 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies (CHILECON) - Valparaiso, Chile (2019.11.13-2019.11.27)] 2019 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies (CHILECON) - A Survey on Mutation Testing Approaches
Kontar, Karam Al, Naji, Joumana, Demiane, Freddy, Sobeh, Salma, Haraty, RamziYear:
2019
DOI:
10.1109/chilecon47746.2019.8987448
File:
PDF, 1.41 MB
2019