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[IEEE 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Auckland, New Zealand (2019.5.20-2019.5.23)] 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Monitoring the Ratio Error Drift of CVTs Connected to the Same Phase along with KDE-PCA
Zhang, Chuanji, Meng, Zhan, Chen, Mianzhou, Jiao, Yang, Chen, Qing, Li, HongbinYear:
2019
DOI:
10.1109/i2mtc.2019.8827173
File:
PDF, 1.97 MB
2019