[IEEE 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Beijing, China (2018.5.16-2018.5.18)] 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Experimental verification of SEU monitor with heavy ions
BAI, Hua, ZHONG, Zhengyu, FENG, Guoqiang, SUN, Xupeng, DI, Tong, CHEN, Dongmei, YANG, Hui, LIU, Jie, GUO, GangYear:
2018
DOI:
10.1109/icreed.2018.8905089
File:
PDF, 2.64 MB
2018