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[IEEE 2019 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2019.12.7-2019.12.11)] 2019 IEEE International Electron Devices Meeting (IEDM) - Novel Concept of the Transistor Variation Directed Toward the Circuit Implementation of Physical Unclonable Function (PUF) and True-random-number Generator (TRNG)
Xiao, Y., Hsieh, E. R., Chung, Steve S., Chen, T. R, Huang, S. A., Chen, T. J., Cheng, OsbertYear:
2019
DOI:
10.1109/iedm19573.2019.8993496
File:
PDF, 640 KB
2019