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[IEEE 2019 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2019.12.7-2019.12.11)] 2019 IEEE International Electron Devices Meeting (IEDM) - Role of correlation in systematic variation modeling

Roy, Ananda S., Dongaonkar, Sourabh, Mudanai, Sivakumar P.
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Year:
2019
DOI:
10.1109/iedm19573.2019.8993563
File:
PDF, 2.99 MB
2019
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