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[IEEE 2019 IEEE 8th Joint International Information Technology and Artificial Intelligence Conference (ITAIC) - Chongqing, China (2019.5.24-2019.5.26)] 2019 IEEE 8th Joint International Information Technology and Artificial Intelligence Conference (ITAIC) - A Hot-Swap Solution for Mini Field Test Bus
Zhu, Liwen, Yu, Lei, Jin, Chuanxi, Chen, Panhui, Liu, MinghuiYear:
2019
DOI:
10.1109/itaic.2019.8785753
File:
PDF, 5.80 MB
2019