Extension of the Density-Gradient Model to the Second-Order Quantum Correction for Analysis of the Single-Charge Effect in Sub-10-nm MOS Devices
Rhee, Sungman, Kim, Daewon, Kim, Kyeongyeon, Choi, Seongwook, Park, Byung-Gook, Park, Young JuneYear:
2020
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2020.2971426
File:
PDF, 1.78 MB
2020