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Exploring the Impact of Variability in Resistance Distributions of RRAM on the Prediction Accuracy of Deep Learning Neural Networks
Prabhu, Nagaraj Lakshmana, Loy Jia Jun, Desmond, Dananjaya, Putu Andhita, Lew, Wen Siang, Toh, Eng Huat, Raghavan, NagarajanVolume:
9
Journal:
Electronics
DOI:
10.3390/electronics9030414
Date:
February, 2020
File:
PDF, 1.63 MB
2020