Electron mobility in silicon nanowires using nonlinear...

Japanese Journal of Applied Physics 2020 / 03 Vol. 59; Iss. 3

Electron mobility in silicon nanowires using nonlinear surface roughness scattering model

Duan, Jiahui, Xiang, Jinjuan, Zhou, Lixing, Wang, Xiaolei, Ma, Xueli, Wang, Wenwu
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Volume:
59
Journal:
Japanese Journal of Applied Physics
DOI:
10.35848/1347-4065/ab7722
Date:
March, 2020
File:
PDF, 922 KB
2020
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