Fixed Pattern Noise Analysis for Feature Descriptors in CMOS APS Images
Zapata-Pérez, Juan, Doménech-Asensi, Ginés, Ruiz-Merino, Ramón, MartÃnez-Ãlvarez, Jose Javier, Fernández-Berni, Jorge, Carmona-Galán, RicardoVolume:
21
Journal:
Sensing and Imaging
DOI:
10.1007/s11220-020-0278-3
Date:
December, 2020
File:
PDF, 4.82 MB
2020