Raman evidence for absence of phase transitions in negative differential resistance thin film devices of niobium dioxide
Fakih, Ali, Shinde, Onkar, Biscaras, Johan, Shukla, AbhayVolume:
127
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5140543
Date:
February, 2020
File:
PDF, 2.11 MB
2020