[IEEE 2019 IEEE International Conference on Imaging Systems and Techniques (IST) - Abu Dhabi, United Arab Emirates (2019.12.9-2019.12.10)] 2019 IEEE International Conference on Imaging Systems and Techniques (IST) - Multi-spectral Imaging To Detect Artificial Ripening Of Banana: A Comprehensive Empirical Study
Vetrekar, Narayan, Ramachandra, Raghavendra, Raja, Kiran B., Gad, R. S.Year:
2019
DOI:
10.1109/IST48021.2019.9010525
File:
PDF, 1.02 MB
2019