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Dielectric and electrical properties of annealed ZnS thin films. The appearance of the OLPT conduction mechanism in chalcogenides
Koaib, J., Bouguila, N., Abassi, H., Moutia, N., Kraini, M., Timoumi, A., Vázquez-Vázquez, C., Khirouni, K., Alaya, S.Volume:
10
Year:
2020
Journal:
RSC Advances
DOI:
10.1039/c9ra10284a
File:
PDF, 4.11 MB
2020