Charge exchange recombination spectroscopy at Wendelstein 7-X
Ford, O. P., Vanó, L., Alonso, J. A., Baldzuhn, J., Beurskens, M. N. A., Biedermann, C., Bozhenkov, S. A., Fuchert, G., Geiger, B., Hartmann, D., Jaspers, R. J. E., Kappatou, A., Langenberg, A., LazeVolume:
91
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5132936
Date:
February, 2020
File:
PDF, 3.86 MB
2020