Study of Positive-Gate-Bias-Induced Hump Phenomenon in...

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IEEE Transactions on Electron Devices 2020

Study of Positive-Gate-Bias-Induced Hump Phenomenon in Amorphous Indium-Gallium-Zinc Oxide Thin-Film Transistors

Shi, Xuewen, Yang, Guanhua, Wang, Jiawei, Lu, Nianduan, Geng, Di, Li, Ling, Liu, Ming, Lu, Congyan, Duan, Xinlv, Chen, Qian, Ji, Hansai, Su, Yue, Chuai, Xichen, Liu, Dongyang, Zhao, Ying
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Year:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2972978
File:
PDF, 1.97 MB
2020
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