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[IEEE 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk (2018.10.2-2018.10.6)] 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Ellipsometry as a Method for Diagnostics of Heterostructures
Gayvonenko, Aleksandra E., Yelistratova, Irina B.Year:
2018
DOI:
10.1109/apeie.2018.8546147
File:
PDF, 476 KB
2018