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[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - Effectively Using Machine Learning to Expedite System Level Test Failure Debug
Rojas, Luis D., Hess, Kevin, Carter-Brown, ChristinaYear:
2019
DOI:
10.1109/itc44170.2019.9000163
File:
PDF, 3.49 MB
2019