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[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - A Robust Dual Directional SCR without Current Saturation Effect for ESD Applications
Du, Feibo, Dong, Xiaoyu, Yang, Chengjin, Xu, YiChen, Liu, Zhiwei, Liu, Jizhi, Liou, Juin J.Year:
2019
DOI:
10.1109/ipfa47161.2019.8984838
File:
PDF, 927 KB
2019