Temporally- and Spatially-Resolved Observations of Current...

IEEE Transactions on Device and Materials Reliability 2019 / 12 Vol. 19; Iss. 4

Temporally- and Spatially-Resolved Observations of Current Filament Dynamics in Insulated Gate Bipolar Transistor Chip During Avalanche Breakdown

Endo, Koichi, Nakamae, Koji
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Volume:
19
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2019.2953197
Date:
December, 2019
File:
PDF, 488 KB
2019
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