[IEEE 2019 24th Microoptics Conference (MOC) - Toyama,...

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[IEEE 2019 24th Microoptics Conference (MOC) - Toyama, Japan (2019.11.17-2019.11.20)] 2019 24th Microoptics Conference (MOC) - Thin Multi-Aperture Microscope

Schacke, Stephan, Berlich, Rene, Hofer, Bernd, Dannberg, Peter, Zaage, Ben, Beckert, Erik, Danz, Norbert
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Year:
2019
DOI:
10.23919/MOC46630.2019.8982890
File:
PDF, 1.90 MB
2019
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