Proton-induced single-event effects on 28 nm Kintex-7 FPGA

Microelectronics Reliability 2020 / 04 Vol. 107

Proton-induced single-event effects on 28 nm Kintex-7 FPGA

Wang, Zibo, Chen, Wei, Yao, Zhibin, Zhang, Fengqi, Luo, Yinhong, Tang, Xiaobin, Guo, Xiaoqiang, Ding, Lili, Peng, Cong
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Volume:
107
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113594
Date:
April, 2020
File:
PDF, 1.35 MB
2020
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