Automatic detection of defect positions including interface...

Optics and Lasers in Engineering 2020 / 06 Vol. 129

Automatic detection of defect positions including interface dislocations and strain measurement in Ge/Si heterostructure from moiré phase processing of TEM image

Wang, Qinghua, Ri, Shien, Xia, Peng, Liu, Zhanwei
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Volume:
129
Journal:
Optics and Lasers in Engineering
DOI:
10.1016/j.optlaseng.2020.106077
Date:
June, 2020
File:
PDF, 3.16 MB
2020
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