TPD characterization of Al-OD-Si sites at the interface of...

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Surface Science 2020 / 2

TPD characterization of Al-OD-Si sites at the interface of bilayer Al0.42Si0.58O2/Ru(0001) thin-films.

Dhar, Bijoya, Pollock, Joshua, Gloria, Jillian, Kaden, William E.
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Journal:
Surface Science
DOI:
10.1016/j.susc.2020.121595
Date:
February, 2020
File:
PDF, 1.18 MB
2020
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