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[IEEE 2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA) - Orlando, FL (2018.12.17-2018.12.20)] 2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA) - Detecting Star Cracks in Topography Images of Specular Back Surfaces of Structured Wafers
Kofler, Corinna, Muhr, Robert, Spock, GunterYear:
2018
DOI:
10.1109/ICMLA.2018.00067
File:
PDF, 1.60 MB
2018