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[IEEE 2019 IEEE International Conference on Imaging Systems and Techniques (IST) - Abu Dhabi, United Arab Emirates (2019.12.9-2019.12.10)] 2019 IEEE International Conference on Imaging Systems and Techniques (IST) - Baking Status Characterization of Baked Food Image Based on Superpixel Segmentation
Wang, Conghui, Hou, Bochuan, Shi, Jing, Yang, Jianhua, Wu, Boning, Fu, Zixing, Fang, KunYear:
2019
DOI:
10.1109/IST48021.2019.9010460
File:
PDF, 15.51 MB
2019