[IEEE 2019 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE) - Bangalore, India (2019.11.15-2019.11.16)] 2019 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE) - Tiny Object Detection:Comparative Study using Single Stage CNN Object Detectors
Gopal, Rakshitha, Kuinthodu, Sandeep, Balamurugan, Muthukumar, Atique, MallabadkarYear:
2019
DOI:
10.1109/WIECON-ECE48653.2019.9019951
File:
PDF, 970 KB
2019