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[IEEE 2019 IEEE AUTOTESTCON - National Harbor, MD, USA (2019.8.26-2019.8.29)] 2019 IEEE AUTOTESTCON - Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko, Odintsov, Sergei, Devadze, Sergei, Jutman, Artur, Aleksejev, Igor, Wenzel, ThomasYear:
2019
DOI:
10.1109/autotestcon43700.2019.8961057
File:
PDF, 611 KB
2019