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[IEEE 2019 IEEE East-West Design & Test Symposium (EWDTS) - Batumi, Georgia (2019.9.13-2019.9.16)] 2019 IEEE East-West Design & Test Symposium (EWDTS) - On a Method for Segmentation of Memory Instances with Row Redundancies
Amirkhanyan, Karen, Vardanian, ValeryYear:
2019
DOI:
10.1109/ewdts.2019.8884474
File:
PDF, 1.31 MB
2019