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[IEEE 2019 IEEE 3rd Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) - Chongqing, China (2019.10.11-2019.10.13)] 2019 IEEE 3rd Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) - Fault Diagnosis of Analog Circuits Based on KPCA and SVM
Li, Yang, Zhang, Rui, Guo, Yinjng, Huan, Pengfei, Wang, Hengtong, Chen, DelongYear:
2019
DOI:
10.1109/imcec46724.2019.8983868
File:
PDF, 543 KB
2019