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[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - Deploying A Machine Learning Solution As A Surrogate
Shan, Chuanhe, Wahba, Ahmed, Wang, Li-C., Sumikawa, NikYear:
2019
DOI:
10.1109/itc44170.2019.9000109
File:
PDF, 3.32 MB
2019