Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs
Tsukamoto, Hiroki, Shintani, Michihiro, Sato, TakashiYear:
2020
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2020.2975300
File:
PDF, 1.66 MB
2020